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"Analysis and resolution of a thermally accelerated early life failure ..."
Donald A. Gajewski, Randall D. Lewis, Benjamin M. Decker (2014)
- Donald A. Gajewski, Randall D. Lewis, Benjamin M. Decker:
Analysis and resolution of a thermally accelerated early life failure mechanism in a 40 V GaN FET. Microelectron. Reliab. 54(12): 2675-2681 (2014)
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