"Reliability comparison of 28V-50V GaN-on-SiC S-band and X-band technologies."

Donald A. Gajewski et al. (2018)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2018.02.018

access: closed

type: Journal Article

metadata version: 2025-01-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/GajewskiGSWBMP18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/GajewskiGSWBMP18
Donald A. Gajewski, Satyaki Ganguly, Scott T. Sheppard, Simon Wood, Jeff B. Barner, Jim W. Milligan, John Palmour:
Reliability comparison of 28V-50V GaN-on-SiC S-band and X-band technologies. Microelectron. Reliab. 84: 1-6 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.