Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Evolution of C-V and I-V characteristics for a commercial 600 V GaN ..."

Jian-Zhi Fu et al. (2018)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2018.06.034

access: closed

type: Journal Article

metadata version: 2021-10-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/FuFKD18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/FuFKD18
Jian-Zhi Fu, François Fouquet, Moncef Kadi, Pascal Dherbécourt:
Evolution of C-V and I-V characteristics for a commercial 600 V GaN GIT power device under repetitive short-circuit tests. Microelectron. Reliab. 88-90: 652-655 (2018)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.