"Life margin assessment with Physics of Failure Tools application to BGA ..."

Bruno Foucher et al. (2006)

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DOI: 10.1016/J.MICROREL.2005.08.005

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type: Journal Article

metadata version: 2021-07-06

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Bruno Foucher, J. Tomas, F. Mounsi, M. Jeremias:
Life margin assessment with Physics of Failure Tools application to BGA packages. Microelectron. Reliab. 46(5-6): 1013-1018 (2006)

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