"A review of reliability prediction methods for electronic devices."

B. Foucher et al. (2002)

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DOI: 10.1016/S0026-2714(02)00087-2

access: closed

type: Journal Article

metadata version: 2020-02-22

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B. Foucher, J. Boullié, B. Meslet, D. Das:
A review of reliability prediction methods for electronic devices. Microelectron. Reliab. 42(8): 1155-1162 (2002)

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