"Fast power cycling protocols implemented in an automated test bench ..."

François Forest et al. (2015)

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DOI: 10.1016/J.MICROREL.2014.09.008

access: closed

type: Journal Article

metadata version: 2020-02-22

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François Forest, Amgad Rashed, Jean-Jacques Huselstein, Thierry Martiré, Philippe Enrici:
Fast power cycling protocols implemented in an automated test bench dedicated to IGBT module ageing. Microelectron. Reliab. 55(1): 81-92 (2015)

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