"ANSYS based 3D electro-thermal simulations for the evaluation of power ..."

Stefano de Filippis et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.047

access: closed

type: Journal Article

metadata version: 2021-10-14

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Stefano de Filippis, Vladimír Kosel, Donald Dibra, Stefan Decker, Helmut Köck, Andrea Irace:
ANSYS based 3D electro-thermal simulations for the evaluation of power MOSFETs robustness. Microelectron. Reliab. 51(9-11): 1954-1958 (2011)

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