"A new approach to the modeling of oxide breakdown on CMOS circuits."

Raul Fernández et al. (2004)

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DOI: 10.1016/J.MICROREL.2004.07.026

access: closed

type: Journal Article

metadata version: 2021-07-14

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Raul Fernández, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich:
A new approach to the modeling of oxide breakdown on CMOS circuits. Microelectron. Reliab. 44(9-11): 1519-1522 (2004)

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