"Statistical nature of hard breakdown recovery in high-κ dielectric ..."

Xuan Feng et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.104

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type: Journal Article

metadata version: 2023-03-21

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Xuan Feng, Nagarajan Raghavan, Sen Mei, Shurong Dong, Kin Leong Pey, Hei Wong:
Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress. Microelectron. Reliab. 88-90: 164-168 (2018)

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