"Effects of radiation and charge trapping on the reliability of high-kappa ..."

J. A. Felix et al. (2004)

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DOI: 10.1016/J.MICROREL.2003.12.005

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type: Journal Article

metadata version: 2020-02-22

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J. A. Felix, J. R. Schwank, Daniel M. Fleetwood, M. R. Shaneyfelt, Evgeni P. Gusev:
Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics. Microelectron. Reliab. 44(4): 563-575 (2004)

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