"An adaptive Cu trace fatigue model based on average cross-section strain."

D. Farley et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.06.114

access: closed

type: Journal Article

metadata version: 2020-11-06

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D. Farley, Yi Zhou, A. Dasgupta, J. W. C. DeVries:
An adaptive Cu trace fatigue model based on average cross-section strain. Microelectron. Reliab. 52(11): 2763-2772 (2012)

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