"Static and low frequency noise characterization of surface- and ..."

M. Fadlallah et al. (2002)

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DOI: 10.1016/S0026-2714(01)00232-3

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/FadlallahGJZG02
M. Fadlallah, Gérard Ghibaudo, Jalal Jomaah, M. Zoaeter, G. Guégan:
Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs. Microelectron. Reliab. 42(1): 41-46 (2002)

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