"Investigation of defects introduced by static and dynamic hot carrier ..."

M. A. Exarchos et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.07.024

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type: Journal Article

metadata version: 2022-10-02

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M. A. Exarchos, George J. Papaioannou, Jalal Jomaah, Francis Balestra:
Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs. Microelectron. Reliab. 49(9-11): 1018-1023 (2009)

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