"Workload and temperature dependent evaluation of BTI-induced lifetime ..."

Behzad Eghbalkhah et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Behzad Eghbalkhah, Mehdi Kamal, Hassan Afzali-Kusha, Ali Afzali-Kusha, M. B. Ghaznavi-Ghoushchi, Massoud Pedram:
Workload and temperature dependent evaluation of BTI-induced lifetime degradation in digital circuits. Microelectron. Reliab. 55(8): 1152-1162 (2015)

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