"Thermal and electrostatic reliability characterization in RF MEMS switches."

Q.-H. Duong et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.095

access: closed

type: Journal Article

metadata version: 2021-10-14

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Q.-H. Duong, Lionel Buchaillot, Dominique Collard, Petra Schmitt, Xavier Lafontan, Patrick Pons, F. Flourens, Francis Pressecq:
Thermal and electrostatic reliability characterization in RF MEMS switches. Microelectron. Reliab. 45(9-11): 1790-1793 (2005)

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