"Near-field EMC study to improve electronic component reliability."

Geneviève Duchamp, D. Castagnet, Alain Meresse (2007)

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DOI: 10.1016/J.MICROREL.2007.07.044

access: closed

type: Journal Article

metadata version: 2020-02-22

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Geneviève Duchamp, D. Castagnet, Alain Meresse:
Near-field EMC study to improve electronic component reliability. Microelectron. Reliab. 47(9-11): 1668-1672 (2007)

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