"An analytic method to compute the stress dependence on the dimensions and ..."

Renan Trevisoli Doria et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.10.007

access: closed

type: Journal Article

metadata version: 2023-09-30

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Renan Trevisoli Doria, João Antonio Martino, Eddy Simoen, Cor Claeys, Marcelo Antonio Pavanello:
An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices. Microelectron. Reliab. 52(3): 519-524 (2012)

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