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"Effects of burn-in stressing on post-irradiation annealing response of ..."

Snezana Djoric-Veljkovic et al. (2003)

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DOI: 10.1016/S0026-2714(03)00258-0

access: closed

type: Journal Article

metadata version: 2023-09-30

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Snezana Djoric-Veljkovic, Ivica Manic, Vojkan Davidovic, Snezana Golubovic, Ninoslav Stojadinovic:
Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs. Microelectron. Reliab. 43(9-11): 1455-1460 (2003)

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