"On the correlation between radiation-induced oxide- and border-trap ..."

Boualem Djezzar (2002)

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DOI: 10.1016/S0026-2714(02)00242-1

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type: Journal Article

metadata version: 2020-02-22

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Boualem Djezzar:
On the correlation between radiation-induced oxide- and border-trap effects in the gate-oxide nMOSFET's. Microelectron. Reliab. 42(12): 1865-1874 (2002)

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