"An overview of hot-carrier induced degradation in 0.25 mum Partially and ..."

François Dieudonné et al. (2001)

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DOI: 10.1016/S0026-2714(01)00165-2

access: closed

type: Journal Article

metadata version: 2020-02-22

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François Dieudonné, F. Daugé, Jalal Jomaah, C. Raynaud, Francis Balestra:
An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's. Microelectron. Reliab. 41(9-10): 1417-1420 (2001)

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