"Improved low frequency noise characteristics of sub-micron MOSFETs with ..."

Siva Prasad Devireddy et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.05.006

access: closed

type: Journal Article

metadata version: 2020-02-22

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Siva Prasad Devireddy, Bigang Min, Zeynep Çelik-Butler, Hsing-Huang Tseng, Philip J. Tobin, Ania Zlotnicka:
Improved low frequency noise characteristics of sub-micron MOSFETs with TaSiN/TiN gate on ALD HfO₂ dielectric. Microelectron. Reliab. 47(8): 1228-1232 (2007)

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