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"A New Versatile Testing Interface for Failure Analysis in Integrated Circuits."
Romain Desplats, Philippe Perdu, Felix Beaudoin (2001)
- Romain Desplats, Philippe Perdu, Felix Beaudoin:
A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. Microelectron. Reliab. 41(9-10): 1495-1499 (2001)
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