"On the profile of frequency and voltage dependent interface states and ..."

S. Demirezen et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.05.010

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type: Journal Article

metadata version: 2024-05-07

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S. Demirezen, S. Altindal, Suleyman Özçelik, Ekmel Özbay:
On the profile of frequency and voltage dependent interface states and series resistance in (Ni/Au)/Al_0.22Ga_0.78N/AlN/GaN heterostructures by using current-voltage (I-V) and admittance spectroscopy methods. Microelectron. Reliab. 51(12): 2153-2162 (2011)

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