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"Tunnel FET technology: A reliability perspective."

Suman Datta, Huichu Liu, Vijaykrishnan Narayanan (2014)

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DOI: 10.1016/J.MICROREL.2014.02.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Suman Datta, Huichu Liu, Vijaykrishnan Narayanan:
Tunnel FET technology: A reliability perspective. Microelectron. Reliab. 54(5): 861-874 (2014)

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