"Repetitive high peak current pulsed discharge film-capacitor reliability ..."

H. Q. S. Dang et al. (2012)

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DOI: 10.1016/J.MICROREL.2012.07.006

access: closed

type: Journal Article

metadata version: 2020-02-22

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H. Q. S. Dang, Martin R. Corfield, Alberto Castellazzi, C. Mark Johnson, Patrick Wheeler:
Repetitive high peak current pulsed discharge film-capacitor reliability testing. Microelectron. Reliab. 52(9-10): 2301-2305 (2012)

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