"Reliability of Metamorphic HEMTs for Power Applications."

Maximilian Dammann et al. (2002)

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DOI: 10.1016/S0026-2714(02)00192-0

access: closed

type: Journal Article

metadata version: 2020-02-22

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Maximilian Dammann, F. Benkhelifa, M. Meng, W. Jantz:
Reliability of Metamorphic HEMTs for Power Applications. Microelectron. Reliab. 42(9-11): 1569-1573 (2002)

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