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"Magnetic emission mapping for passive integrated components characterisation."
Olivier Crépel et al. (2003)
- Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina:
Magnetic emission mapping for passive integrated components characterisation. Microelectron. Reliab. 43(9-11): 1809-1814 (2003)
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