"Backside Hot Spot Detection Using Liquid Crystal Microscopy."

Olivier Crépel et al. (2002)

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DOI: 10.1016/S0026-2714(02)00223-8

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/CrepelBMHCGPDL02
Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis:
Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectron. Reliab. 42(9-11): 1741-1746 (2002)

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