"High-field step-stress and long term stability of PHEMTs with different ..."

Paolo Cova et al. (2002)

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DOI: 10.1016/S0026-2714(02)00195-6

access: closed

type: Journal Article

metadata version: 2020-02-22

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Paolo Cova, Roberto Menozzi, Maximilian Dammann, T. Feltgen, W. Jantz:
High-field step-stress and long term stability of PHEMTs with different gate and recess lengths. Microelectron. Reliab. 42(9-11): 1587-1592 (2002)

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