"Investigation of layout effects in diode-triggered SCRs under very-fast ..."

Tommaso Cilento et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.064

access: closed

type: Journal Article

metadata version: 2020-02-22

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Tommaso Cilento, Chan-Su Yun, Arsen Terterian, Chang Hwi Lee, Jung Eon Moon, Si Woo Lee, Hyoungcheol Kwon, Manho Seung, Seokkiu Lee:
Investigation of layout effects in diode-triggered SCRs under very-fast TLP stress through full-size, calibrated 3D TCAD simulation. Microelectron. Reliab. 88-90: 1103-1107 (2018)

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