"Hierarchical test generation for combinational circuits with real defects ..."

T. Cibáková et al. (2002)

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DOI: 10.1016/S0026-2714(02)00080-X

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - https://dblp.org/rec/journals/mr/CibakovaFGKPRU02
T. Cibáková, Mária Fischerová, Elena Gramatová, Wieslaw Kuzmicz, Witold A. Pleskacz, Jaan Raik, Raimund Ubar:
Hierarchical test generation for combinational circuits with real defects coverage. Microelectron. Reliab. 42(7): 1141-1149 (2002)

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