"An investigation of surface state capture cross-sections for ..."

Fu-Chien Chiu et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.01.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/ChiuSLH07
Fu-Chien Chiu, Wen-Chieh Shih, Joseph Ya-min Lee, Huey-Liang Hwang:
An investigation of surface state capture cross-sections for metal-oxide-semiconductor field-effect transistors using HfO₂ gate dielectrics. Microelectron. Reliab. 47(4-5): 548-551 (2007)

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