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"Electrical and reliability characteristics of GaAs MOSHEMTs utilizing ..."
Hsien-Chin Chiu et al. (2010)
- Hsien-Chin Chiu, Chao-Hung Chen, Chih-Wei Yang, Jeffrey S. Fu, Cheng-Shun Wang:
Electrical and reliability characteristics of GaAs MOSHEMTs utilizing high-k IIIB and IVB oxide layers. Microelectron. Reliab. 50(5): 631-634 (2010)
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