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"Trap detection in electrically stressed AlGaN/GaN HEMTs using optical pumping."
David J. Cheney et al. (2012)
- David J. Cheney, Rick Deist, Brent P. Gila, Jennilee Navales, Fan Ren, Stephen J. Pearton:
Trap detection in electrically stressed AlGaN/GaN HEMTs using optical pumping. Microelectron. Reliab. 52(12): 2884-2888 (2012)
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