"A statistical approach to characterizing the reliability of systems ..."

Yuan Chen, Qing Wang, Sammy Kayali (2005)

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DOI: 10.1016/J.MICROREL.2005.01.014

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yuan Chen, Qing Wang, Sammy Kayali:
A statistical approach to characterizing the reliability of systems utilizing HBT devices. Microelectron. Reliab. 45(12): 1869-1874 (2005)

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