"A new empirical extrapolation method for time-dependent dielectric ..."

Fen Chen et al. (2002)

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DOI: 10.1016/S0026-2714(01)00261-X

access: closed

type: Journal Article

metadata version: 2020-02-22

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Fen Chen, Rolf-Peter Vollertsen, Baozhen Li, Dave Harmon, Wing L. Lai:
A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO₂ and nitride-oxide dielectrics. Microelectron. Reliab. 42(3): 335-341 (2002)

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