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"Threshold-voltage variability analysis and modeling for junctionless ..."

Chun-Yu Chen, Jyi-Tsong Lin, Meng-Hsueh Chiang (2017)

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DOI: 10.1016/J.MICROREL.2017.05.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chun-Yu Chen, Jyi-Tsong Lin, Meng-Hsueh Chiang:
Threshold-voltage variability analysis and modeling for junctionless double-gate transistors. Microelectron. Reliab. 74: 22-26 (2017)

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