"Interconnect reliability dependence on fast diffusivity paths."

Hajdin Ceric, Roberto Lacerda de Orio, Siegfried Selberherr (2012)

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DOI: 10.1016/J.MICROREL.2011.09.035

access: closed

type: Journal Article

metadata version: 2021-10-14

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Hajdin Ceric, Roberto Lacerda de Orio, Siegfried Selberherr:
Interconnect reliability dependence on fast diffusivity paths. Microelectron. Reliab. 52(8): 1532-1538 (2012)

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