"A study of SiC Power BJT performance and robustness."

Alberto Castellazzi et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.046

access: closed

type: Journal Article

metadata version: 2024-07-29

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Alberto Castellazzi, T. Takuno, Ryutaro Onishi, Tsuyoshi Funaki, Tsunenobu Kimoto, Takashi Hikihara:
A study of SiC Power BJT performance and robustness. Microelectron. Reliab. 51(9-11): 1773-1777 (2011)

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