"Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in ..."

Alberto Castellazzi et al. (2003)

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DOI: 10.1016/S0026-2714(03)00319-6

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type: Journal Article

metadata version: 2024-10-06

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Alberto Castellazzi, V. Kartal, R. Kraus, Norbert Seliger, Martin Honsberg-Riedl, Doris Schmitt-Landsiedel:
Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's. Microelectron. Reliab. 43(9-11): 1877-1882 (2003)

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