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"SiC power MOSFETs performance, robustness and technology maturity."

Alberto Castellazzi et al. (2016)

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DOI: 10.1016/J.MICROREL.2015.12.034

access: closed

type: Journal Article

metadata version: 2022-03-23

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  - https://dblp.org/rec/journals/mr/CastellazziFRYR16
Alberto Castellazzi, Asad Fayyaz, Gianpaolo Romano, Li Yang, Michele Riccio, Andrea Irace:
SiC power MOSFETs performance, robustness and technology maturity. Microelectron. Reliab. 58: 164-176 (2016)

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