"A study of the threshold-voltage suitability as an application-related ..."

Alberto Castellazzi et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.035

access: closed

type: Journal Article

metadata version: 2020-02-22

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Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, M. Piton, Michel Mermet-Guyennet:
A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs. Microelectron. Reliab. 47(9-11): 1713-1718 (2007)

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