"Reliability improvement of high value doped polysilicon-based resistors."

E. Carvou et al. (2002)

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DOI: 10.1016/S0026-2714(02)00151-8

access: closed

type: Journal Article

metadata version: 2020-09-25

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E. Carvou, F. Le Bihan, Anne Claire Salaün, R. Rogel, Olivier Bonnaud, Yannick Rey-Tauriac, Xavier Gagnard, L. Roland:
Reliability improvement of high value doped polysilicon-based resistors. Microelectron. Reliab. 42(9-11): 1369-1372 (2002)

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