"Investigation and modeling of stressed thermal oxides."

Domenico Caputo, Fernanda Irrera (2002)

> Home

Details and statistics

DOI: 10.1016/S0026-2714(01)00257-8

access: closed

type: Journal Article

metadata version: 2024-08-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/CaputoI02
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/CaputoI02
Domenico Caputo, Fernanda Irrera:
Investigation and modeling of stressed thermal oxides. Microelectron. Reliab. 42(3): 327-333 (2002)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.