"Ultra wide voltage range consideration of reliability-aware STT magnetic ..."

Hao Cai et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.023

access: closed

type: Journal Article

metadata version: 2024-12-11

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Hao Cai, You Wang, Lirida A. B. Naviner, W. S. Zhao:
Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28 nm FDSOI technology. Microelectron. Reliab. 55(9-10): 1323-1327 (2015)

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