"Mechanical analysis of wafer testing with FEM simulations."

Angel Ochoa Brezmes, Cornelia Breitkopf (2016)

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DOI: 10.1016/J.MICROREL.2016.06.006

access: closed

type: Journal Article

metadata version: 2020-02-22

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Angel Ochoa Brezmes, Cornelia Breitkopf:
Mechanical analysis of wafer testing with FEM simulations. Microelectron. Reliab. 63: 166-182 (2016)

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