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"Design automation to suppress cable discharge event (CDE) induced latchup ..."

Ciaran J. Brennan et al. (2007)

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DOI: 10.1016/J.MICROREL.2006.11.008

access: closed

type: Journal Article

metadata version: 2023-02-02

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Ciaran J. Brennan, Kiran V. Chatty, Jeff Sloan, Paul Dunn, Mujahid Muhammad, Robert Gauthier:
Design automation to suppress cable discharge event (CDE) induced latchup in 90 nm CMOS ASICs. Microelectron. Reliab. 47(7): 1069-1073 (2007)

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