"Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS ..."

Alain Bravaix et al. (2016)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2016.07.092

access: closed

type: Journal Article

metadata version: 2022-03-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/BravaixCFNMH16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/BravaixCFNMH16
Alain Bravaix, Florian Cacho, X. Federspiel, Cheikh Ndiaye, Souhir Mhira, Vincent Huard:
Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes. Microelectron. Reliab. 64: 163-167 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.