"A method of thermal testing of microsystems."

Piotr Bratek, Andrzej Kos (2001)

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DOI: 10.1016/S0026-2714(01)00088-9

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type: Journal Article

metadata version: 2025-01-19

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Piotr Bratek, Andrzej Kos:
A method of thermal testing of microsystems. Microelectron. Reliab. 41(11): 1877-1887 (2001)

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