"Automated inspection and classification of flip-chip-contacts using ..."

Sebastian Brand et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.139

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type: Journal Article

metadata version: 2023-09-30

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Sebastian Brand, P. Czurratis, P. Hoffrogge, Matthias Petzold:
Automated inspection and classification of flip-chip-contacts using scanning acoustic microscopy. Microelectron. Reliab. 50(9-11): 1469-1473 (2010)

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